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本文研究了ZnO压敏电阻在交流和直流电压的长期作用下,漏电流的蠕变规律、Ⅴ-Ⅰ特性的变化以及热激活电流;在肖特基势垒热电子发射导电模型的基础上,分析了ZnO压敏电阻小电流性能的蜕变机制。从理论到实验研究了不同配方和工艺以提高ZnO压敏电阻的电流稳定性的方法。结果认为:适量的掺硼和适当的热处理工艺,都能改善ZnO压敏电阻的电流稳定性,而热处理方法更容易得到好的效果,同时也提出了上述方法对大电流性能可能带来的影响。
In this paper, the creep regularity of leakage current, the change of V-Ⅰ characteristics and the thermal activation current of ZnO varistor under the action of AC and DC voltage are studied. Based on Schottky barrier thermal electron emission model, The mechanism of the degeneration of ZnO varistor with small current is analyzed. From theory to experiment, different formulations and processes were studied to improve the current stability of ZnO varistors. The results show that proper amount of boron and proper heat treatment process can improve the current stability of ZnO varistor, while the heat treatment method is easier to get good results. At the same time, it also put forward the possible impact of the above method on the large current performance .