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基本参数法具有校准元素间的相互影响的功能,同时由于在其浓度归一化的过程中能够消去测量面积和探测立体角项,因此具有校正样品测量面积和形状影响的能力,十分适于贵金属合金及其饰物的分析。本文报道用R Ⅸ 2100型X射线荧光光谱仪分析贵金属合金及其饰物样品的方法。实验表明,通过选择适当的测量谱线和背景测量角度,并将邻近谱线对测量谱线背景的影响作为谱线重叠处理,可以确保分析的准确度。同一样品不同测量面积下得到的分析值的一致性良好;形状与标准样相差很大的实际样品的分析结果也令人满意。用不同样品各进行8次重复分析得到的各元素的分析精密度(RSD％)分别为:Au(96.99％)=0.02,Au(75.00％)=0.04;Ag(1.02％)=1.48,Ag(8.96％)=0.35;Cu(1.00％)=0.83,Cu(15.97％)=0.15;Zn(1.01％)=0.70;Pt(80.00％)=0.03;Pd(19.92％)=0.17;Ni(99.99％)=0.004。
The basic parametric method has the function of calibrating the interaction between elements and at the same time has the ability to correct for sample area and shape corrections due to the elimination of the measurement area and the detection of solid angle terms in the normalization of its concentration and is well suited for precious metals Alloy and its accessories analysis. This paper reports a method for the analysis of precious metal alloys and their ornaments by R Ⅸ 2100 X-ray fluorescence spectrometer. Experiments show that the accuracy of the analysis can be ensured by choosing the appropriate measurement line and background measurement angle, and the influence of adjacent lines on the measured line background as the line overlap. The consistency of the analytical values obtained under different measurement areas of the same sample is good; the actual sample whose shape is quite different from that of the standard sample is also satisfactory. The analytical precision (RSD%) of each element obtained by 8 repeated analyzes with different samples was respectively Au (96.99%) = 0.02, Au (75.00%) = 0.04, Ag (1.02%) = 1.48, 8.96%) = 0.35; Cu (1.00%) = 0.83 Cu (15.97%) = 0.15 Zn (1.01%) = 0.70 Pt (80.00%) = 0.03 Pd (19.92% ) = 0.004.