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应用现场椭圆偏振光谱技术并结合循环伏安法,研究了镍电极表面Ni(OH)2与NiOOH的相互转化,以均匀膜模型拟合实验数据获得表面膜厚度的变化规律,采用以光学参量变化速率(Vop)为参数的椭圆偏振光谱方法能直接反映出体系的特征.Vop参量与表面膜厚度的变化率间存在密切关系,Vop反映了电极表面表面膜厚度的变化率.
The interaction between Ni (OH) 2 and NiOOH on nickel electrode was studied by on-site ellipsometry and cyclic voltammetry. The variation of surface film thickness was obtained by fitting the experimental data with a uniform film model. The method of ellipsometry with velocity (Vop) as a parameter directly reflects the characteristics of the system. The relationship between the Vop parameter and the rate of change of surface film thickness is closely related. Vop reflects the rate of change of surface film thickness.