本文提出了有关研制自动测试系统的几个问题,该系统采用了国际电工委员会第444号公告中所推荐的传输测试法。业已证明,当试图对电阻与总并联电容的电抗之比具有很大数值(本文中定义为α)的晶体进行测量时,这种方法是失败的。本文进一步详述了全自动测试系统中电容凋零网络的使用情况。讨论了使用微处理器CPU的自动测试系统,并给出了测量数据。列出了在10兆赫到183兆赫范围内所测得的晶体的测量数据。这些测量说明在频率为1×10~(-8)量级上以及动态参数小于0.5％的标准偏差的可重复性是极好的。 This paper presents several issues related to the development of automated test systems that use the transmission test method recommended by the International Electrotechnical Commission Bulletin 444. It has been demonstrated that this method failed when attempting to measure a crystal with a large ratio of the reactance of the resistor to the total shunt capacitance (defined herein as α). This article further details the use of capacitor dying networks in fully automated test systems. Discussed the use of microprocessor CPU automatic test system, and gives the measurement data. The measured data for the crystals measured in the 10 MHz to 183 MHz range are listed. These measurements show that the repeatability of standard deviations on the order of 1 x 10 ~ (-8) and less than 0.5% of dynamic parameters is excellent.