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针对胚胎电子细胞阵列中测试结构和故障检测定位方法受电子细胞和阵列结构限制较大,故障检测和定位能力有限,硬件资源消耗大等问题,提出一种由可配置边界扫描结构和可配置内部扫描结构组成的新的测试结构。基于这种测试结构,提出了寄存器传输级故障检测和细胞级故障定位相结合的故障检测和定位方法。仿真实验以s27电路为例,详细介绍了故障检测和定位的具体过程并对测试结构的硬件资源消耗进行了分析。仿真和分析结果表明,提出的方法可有效检测并在细胞级定位故障,而且随着阵列规模增大,测试结构的硬件资源消耗所占比例明显下降,适用于大规模胚胎电子细胞阵列。
Aiming at the problems that the test structure and fault detection and location method in embryonic electronic array are limited by the structure of electronic cells and arrays, the ability of fault detection and localization is limited and the hardware resources are consumed, a new method, which consists of configurable boundary scan structure and configurable internal Scan the structure of the new test structure. Based on this test structure, a fault detection and location method combining register-transmission-level fault detection with cell-level fault location is proposed. Taking the s27 circuit as an example, the simulation experiment introduces the specific process of fault detection and location in detail and analyzes the hardware resource consumption of the test structure. Simulation and analysis results show that the proposed method can effectively detect and locate faults at the cell level, and as the size of the array increases, the proportion of hardware resources consumed by the test structure obviously drops, which is suitable for large-scale embryonic electronic cell arrays.