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红外探测器组件作为目标探测和成像系统的核心器件,其空间分辨能力直接影响着探测系统的成像质量。评估探测器组件空间分辨能力时,常使用调制传递函数(MTF),而探测器组件光学串音是影响探测器组件MTF的主要因素。介绍了一套弥散斑直径为30μm的红外小光点测试系统,并用于测试不同结构红外探测器组件的线扩散函数(LSF)来评价组件的光学串音。测试结果表明:叠层电极结构侧面存在的光响应会导致LSF展宽和次峰等现象,该结果为红外探测器组件光学串音设计提供了参考。
As the core device of the target detection and imaging system, the infrared detector module directly affects the imaging quality of the detection system due to its spatial resolution. The modulation transfer function (MTF) is often used to evaluate the spatial resolution of detector components, and the optical crosstalk of detector components is a major factor affecting the MTF of the detector assembly. A set of infrared small spot test system with diffused spot diameter of 30μm was introduced and used to test the linear crosstalk of the components by measuring the line spread function (LSF) of the infrared detectors with different structures. The test results show that the light response of the side of the laminated electrode structure will lead to the LSF broadening and the second peak phenomenon. This result provides a reference for the optical crosstalk design of the infrared detector.