论文部分内容阅读
测定了苹果主干型、开心型及小冠圆头型不同栽培方式下叶幕及地面光合有效辐射(PAR)强度变化。结果表明,主干型与开心型苹果树平均叶幕及果际PAR属高值组,比低值组圆头型树提高了153.5%~179.2%。高值组树形叶幕、果际地面辐射强度及树冠浅表层与内膛PAR强度也显著高于圆头型苹果树。在晴天直射光及阴雨天散射光条件下,不同树形叶幕PAR与地面PAR辐射强度极显著正相关。
The changes of photosynthetic active radiation (PAR) intensity of leaves and ground under different cultivation modes of apple trunk type, happy type and small crown-round type were measured. The results showed that the average leaf and fruit PAR values of the trunk and happy apple trees were 153.5% ~ 179.2% higher than those of the low value group. In the high value group, the leaf radiant intensity of ground surface and the PAR intensity of superficial layer and inner bore of tree crown were also significantly higher than those of round apple tree. Under the conditions of direct light in sunny day and scattered light in rainy day, there was a significant positive correlation between the PAR of different tree leaves and the PAR radiation intensity on the ground.