Organic fi eld-eff ect transistors(OFETs)are fabricated using organic semiconductors(OSCs)as the active layer in the form of thin fi lms.Due to its advantages o
The effects of forming damage are analyzed,which occur during hot stamping process,on the load-carrying capacity and failure mode of hot stamped beams.A damage-
A hollow glass microsphere(HGM)/TiO2 composite hollow sphere was successfully prepared via a simple precipitation method.The TiO2 coating layers grew on the sur