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半导体超晶格物理与器件（１３）彭英才（河北大学电子与信息工程系０７１００２）三、半导体表面与异质结界面的ＳＴＭ观测扫描隧道显微镜（ＳｃａｎｎｉｎｇＴｕｎｎｅｌｉｎｇＭＩｃｒｏｓｔｏｐｙ－ＳＴＭ）是８０年代的初期发展起来的一种新型表面分析技术［２３］。...
(13) Peng Yingcai (Department of Electronic and Information Engineering, Hebei University, 071002) 3. STM Observation of Semiconductor Surface to Heterojunction Interface Scanning Tunneling Microscope (Scanning Tunneling Microscopy-STM) was developed in the early 1980s A new type of surface analysis technique [23]. ...