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随着微电子技术的不断进步,集成电路工艺尺寸不断缩小,工作电压不断降低,节点的临界电荷越来越小,空间辐射引起的单粒子效应逐渐成为影响芯片可靠性的重要因素之一。针对辐射环境中高能粒子对锁存器的影响,提出了一种低开销的抗SEU锁存器(LOHL)。该结构基于C单元的双模冗余,实现对单粒子翻转的防护,从而降低软错误发生的概率。Spice模拟结果显示,与其他相关文献中加固锁存器相比,LOHL在电路面积、延迟和延迟-功耗积上有优势。
With the continuous improvement of microelectronic technology, the process size of integrated circuits is continuously reduced, the operating voltage is continuously reduced, and the critical charge of nodes is getting smaller and smaller. The single-particle effect caused by space radiation gradually becomes one of the important factors that affect the chip reliability. In view of the effect of high energy particles on the latch in the radiation environment, a low-cost anti-SEU latch (LOHL) is proposed. The structure is based on dual-mode redundancy of C cells to provide protection against single-particle flipping, thereby reducing the probability of soft errors occurring. Spice simulation results show that LOHL has advantages in terms of circuit area, delay and delay-power dissipation compared with other related references.