The amorphous (Fe1-xMnx)75P15C10 (0 ≤ x ≥ 0.30) alloys were prepared by the standard melt spinning technique and investigated their crystallization, thermal,
Line broadening in a diffraction intensity profile of powdered crystalline materials due to stacking fault has been characterized in terms of the zeroth, first,
Single crystals of L-Valinium picrate were grown from aqueous solution by slow evaporation technique. Single crystal X-ray diffraction analysis reveals that the