论文部分内容阅读
密码芯片运行时的光辐射可泄露其操作和数据的重要特征信息.基于单光子探测技术,设计并构建了针对CMOS半导体集成电路芯片光辐射信号的采集、传输、处理和分析的光电实验系统.以AT89C52单片机作为实验对象,采用时间相关单光子计数技术,对不同工作电压下密码芯片的光辐射强度进行了对比,分析了芯片指令级光辐射信息的操作依赖性和数据依赖性.此外,使用示波器对时间相关单光子计数技术在芯片光辐射分析上的可行性进行了验证.实验结果表明,采用时间相关单光子计数技术对密码芯片进行光辐射分析,是一种直接有效的中低等代价光旁路分析攻击手段,对密码芯片的安全构成了严重的现实威胁.
The optical radiation during the operation of the cryptographic chip can reveal the important characteristic information of its operation and data.Based on the single-photon detection technology, the optoelectronic experiment system for the collection, transmission, processing and analysis of the optical radiation signal of the CMOS semiconductor integrated circuit chip is designed and constructed. Taking the AT89C52 single-chip microcomputer as the experimental object, the time-dependent single-photon counting technique was used to compare the light intensity of the light-emitting chips with different operating voltages, and the operation dependence and data dependence of the light- The oscilloscope verifies the feasibility of the time-dependent single-photon counting technique in the chip optical radiation analysis.The experimental results show that using the time-dependent single-photon counting technique to analyze the optical radiation of the cryptographic chip is a direct and effective medium- Optical bypass analysis of the means of attack, the security of the cryptographic chip poses a serious real threat.