Q03噪声系数计量装置是按国际电工技术委员会(IEC)第147号标准研制的,用于计量600MHz和1GHz高频小功率低噪声晶体管的噪声系数F和最小噪声系数F_n,以便对晶体管的稳定性、低噪声和增益作出全面的质量评定,是研制和发展高频低噪声晶体管不可缺少的计量手段。本装置在测量高频小功率低噪声晶体管的噪声系数时,系统误差Δ_(SRSS)不大于0.2dB。总的误差(即(?),Δ_f为被测管的随机误差)在600MHz,而Δ_f<0.12dB时,不大于 The Q03 noise figure measuring device was developed according to International Electrotechnical Commission (IEC) No. 147 standard and used to measure the noise figure F and the minimum noise figure F_n of 600MHz and 1GHz low-power, low-power, low-noise transistors in order to evaluate the stability of the transistor , Low noise and gain to make a comprehensive quality assessment, development and development of high-frequency low-noise transistors is an indispensable measure. When the device measures the noise figure of high frequency, low power and low noise transistor, the system error Δ_ (SRSS) is not more than 0.2dB. The total error (ie (?), Δ_f for the measured tube random error) at 600MHz, and Δ_f <0.12dB, not more than