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采用计算机差谱技术校正光谱干扰，在无需知道基体浓度下，对高含量基体或多组分体系中微量元素能进行准确和快速的测定。详细介绍了Ｃ语言编写的实施差谱技术以及实验室例行分析的软件。利用ＰＤＡ或ＣＣＤ检测器同时记录ＩＣＰ－ＡＥＳ发射光谱一段波长范围内信号的优点，差谱法简单易行。对Ｖ基体中Ａｌ，Ａｌ和Ｍｇ基体中Ｖ的测定结果证明，差谱技术能有效地对光谱干扰和背景干扰进行校正。
The spectral difference technique is used to correct the spectral interference, and the accurate and rapid determination of the trace elements in high-content matrix or multi-component system without knowing the matrix concentration can be carried out. Described in detail the implementation of the C language differential techniques and laboratory routine analysis software. The use of a PDA or CCD detector simultaneously records the advantages of the ICP-AES emission spectrum over a wavelength range, and the difference spectrum method is straightforward. The results of the determination of V in Al, Al and Mg matrix in V matrix prove that the difference spectrum technique can effectively correct the spectral interference and background interference.