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大牛地气田下石盒子组的盒2、3段具有3种类型的气层,即正常I型气层(具有高电阻率和相对较低的声波时差)、Ⅱ型低电阻率—高声波时差气层和Ⅲ型低密度气层。其中前两类气层主要为高产气层。以岩心分析化验资料、常规测井资料、特殊测井资料结合其他地质研究资料,分析了Ⅱ型低电阻率—高声波时差气层的成因。研究结果表明,微裂缝和好的储层物性引起的泥浆侵入,储层微孔喉发育引起的束缚水饱和度增大以及绿泥石黏土矿物包壳等因素是形成这类气层的主要原因,其中微裂缝是主要成因。结合裂缝预测成果,进一步验证了这类气层在平面上的分布。
There are three types of gas reservoirs in Boxes 2, 3 of the Lower Shihezi Formation in the Daniudi Gas Field: Normal I gas reservoirs (with high resistivity and relatively low acoustic time lag), Type II low resistivity-high sound waves Jet lag and type III low density gas layer. The first two types of gas layers are mainly high-yield gas layers. Based on the core analysis data, conventional well logging data and special well logging data combined with other geological data, the genesis of Type Ⅱ low resistivity-high acoustic time-lapse gas layer is analyzed. The results show that mud invasion caused by micro-fractures and good reservoir properties, irreducible water saturation caused by pore throat development and chlorite clay mineral inclusions are the main reasons for the formation of such gas reservoirs , Of which micro-cracks are the main cause. Combined with the results of fracture prediction, the distribution of these gas layers in the plane is further verified.