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静态随机存储器(SRAM)的单粒子微闩锁(mSEL)现象可能引起星载计算机运行崩溃,威胁整星运行安全.传统的闩锁电流检测方法难以发现mSEL,国内外研究成果至今没有给出令人满意的具体可行的星上mSEL检测方案,也没有航天工程应用实例.根据SRAM发生mSEL时的错误簇现象,设计了基于EDAC编解码的mSEL检测方案,介绍了软硬件架构,提出了两种检测策略并研究讨论了其性能.其中遍寻策略实现简单、性能稳定,随机搜索策略实现开销大,在某些场景中90%,检出率的要求下,检测速度达到遍寻策略的8.5倍.本文提出的方法能够提高空间应用中SRAM器件可靠性,降低由mSEL引发的系统失效概率.
Single-cell micro-latch (mSEL) phenomenon of static random access memory (SRAM) may cause the operation of on-board computer to collapse and threaten the safety of the whole satellite operation. The traditional latch-up current detection method is difficult to find mSEL, so far the research results at home and abroad have not given People are satisfied with the practical mSEL on-board mSEL detection program, there are no examples of aerospace applications.According to SRAM error occurs when the mSEL cluster design based on EDAC codec mSEL detection program introduced the hardware and software architecture, made two Detection strategy and discuss its performance.While the search strategy is simple, stable performance, random search strategy overhead, in some scenes 90% detection rate requirements, the detection speed of 8.5 times the search strategy The method proposed in this paper can improve the reliability of SRAM devices in space applications and reduce the probability of system failure caused by mSEL.