用高聚物对HMX和RDX等敏感高能炸药晶体进行包复后可降低其感度。采用配备能量色散X射线能谱仪作元素分析的扫描电子显微镜,在显微镜图象与高聚物氟X射线图象比较的基础上,有可能判断晶体包复的质量。 Polymers for HMX and RDX and other sensitive high-energy explosives crystal complex can reduce its sensitivity. Using a scanning electron microscope equipped with an energy-dispersive X-ray spectrometer for elemental analysis, it is possible to judge the quality of the crystal inclusion on the basis of a comparison between a microscope image and a polymer fluoroscopic X-ray image.