Genrad公司研制的1796型数字/模拟测试系统能用于如微处理器、RAM、ROM、UARTS等使用大规模集成电路片的复杂数字板的测试对于动态逻辑的测试,速率能达到兆赫。为了选择被测单元时钟的相位,仪器可用等待的方法使之同步.也可用时钟信号本身来同步。仪器的数字输入/输出是通过一个普通的扫描器 Genrad’s Model 1796 Digital / Analog Test System can be used for testing complex digital boards such as microprocessors, RAM, ROM, UARTS and other large scale integrated circuit chips for dynamic logic testing at rates up to megahertz. In order to select the phase of the unit clock under test, the instrument can be synchronized by means of a wait, or by the clock itself. The digital input / output of the instrument is through a normal scanner