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扫描电镜与APPLE—Ⅱ微型计算机联机可对物体表面特征的一维图象信息进行实时定量分析。通过计算机对形貌特征自动处理和识别。系统的研究国内未见报道。系统能与各种型号扫描电镜联机,它能用于公安痕迹学,金属加工表面分析,材料学和晶体学研究。系统研制采用了图象识别技术中一维信号处理,用一维空间变量的亮度函数表征三维空间的表面特征。系统引自电镜线扫描信号(一维视频信号),经接口装置对信号进行滤波,放大,匹配,同步控制后以幅/40ms速度进入A/D变换。
Scanning electron microscopy and APPLE-Ⅱ micro-computer online on the surface features of the one-dimensional image information for real-time quantitative analysis. Automatic processing and identification of topographical features by computer. No systematic research has been reported in China. System with a variety of models on-line scanning electron microscopy, it can be used for public security traces, metal processing surface analysis, materials science and crystallography. The system uses one-dimensional signal processing in image recognition technology, and uses the luminance function of one-dimensional space to characterize the surface features in three-dimensional space. System from the electron microscope scanning signal (one-dimensional video signal), the signal through the interface device filtering, amplification, matching, synchronous control to amplitude / 40ms speed into the A / D conversion.