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用抗玉米纹枯病自交系CML270和感病自交系478的(CML270×478)×CML270BC1∶2群体共322个株系为作图和定位群体,构建了125个SSR标记位点的遗传连锁图谱,覆盖玉米基因组1939.0cM,平均图距15.5cM.采用复合区间定位分析,检测到玉米纹枯病抗病指数主效QTL位点3个,2个位于第1染色体,1个位于第7染色体上,它们分别能解释表型变异的18%~20%;控制株高的QTL位点7个,分别位于第3~6染色体上,控制“穗位高”的QTL位点5个,分别位于第3,4,6染色体上.自交系CML270玉米纹枯病抗性主效QTL真实存在,抗性与植株高度遗传上不存在连锁关系,为玉米纹枯病分子标记辅助选择(MAS)和抗性基因分离与克隆提供了技术和材料支撑.
A total of 322 lines (CML270 × 478) × CML270BC1: 2 were used as mapping and locating groups for the resistance to corn sheath blight inbred lines CML270 and susceptible inbred lines 478, and 125 SSR marker loci were constructed The linkage map covered 1939.0 cM of maize genome and 15.5 cM of average distance.The maize QTLs for resistance index of maize sheath blight were detected by 3 loci, 2 loci on chromosome 1 and 1 locus on chromosome 7 On the chromosome, they explained 18% ~ 20% of the phenotypic variance respectively. Seven QTLs for controlling plant height were located on chromosomes 3 ~ 6 and 5 QTLs controlling the “ear height” Located on chromosomes 3, 4 and 6. Inbred lines CML270 main effect of corn sheath blight resistance QTL true existence, resistance and plant height are not genetically linked, for corn bran blight molecular marker-assisted selection (MAS) And resistance gene isolation and cloning provided the technical and material support.