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将有源器件的S参数引入到FDTD迭代中,传统方法采用了逆傅立叶变换和复杂的卷积技术。为了避免繁琐的卷积运算,本文首先把测量的S参数转化为Y参数,采用Vector Fitting技术拟合得到Y参数的s域有理多项式,然后通过差分技术或者Z变换技术将Y参数引入到FDTD运算中。另外,为了提高该方法的计算效率及稳定性,利用FDTD方法提取分布元件部分的时域特征模型(TDCM),再结合本文方法全波分析微波有源电路,达到了更好的效果。最后,作为例子模拟了一个微波FET放大器电路,验证了本文方法的有效性和精度。
The S-parameters of active devices are introduced into the FDTD iteration. The traditional method uses inverse Fourier transform and complex convolution techniques. In order to avoid the cumbersome convolution operation, this paper first converts the measured S parameters into Y parameters, then uses Vector Fitting technique to get the s-region rational polynomials of Y parameters. Then the Y parameters are introduced into the FDTD operation by using the differential technique or Z transform in. In addition, in order to improve the computational efficiency and stability of the proposed method, the FDTD method is applied to extract the TDCM (Time Domain Feature Model) of the distributed components, and then the full wave analysis of the microwave active circuit with the proposed method achieves better results. Finally, a microwave FET amplifier circuit is simulated as an example to verify the effectiveness and accuracy of the proposed method.