论文部分内容阅读
Application of the Peierls-Nabarro Model to Symmetric Tilt Low-Angle Grain Boundary with Full〈a〉Disl
【机 构】
:
Center for High-Resolution Electron Microscopy, College of Materials Science and Engineering, Hunan
【出 处】
:
金属学报(英文版)
【发表日期】
:
2016年11期
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