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本文提出了一种基于受控线性反馈移位寄存器(LFSR)进行内建自测试的结构及其测试矢量生成方法。使用受控LFSR可以跳过伪随机测试序列中对故障覆盖率没有贡献的测试矢量,从而达到减少测试矢量长度,缩短测试时间的目的。
This paper presents a built-in self-test based on controlled linear feedback shift register (LFSR) structure and test vector generation method. The controlled LFSR can skip the test vectors that do not contribute to the fault coverage in the pseudo-random test sequence, so as to reduce the test vector length and shorten the test time.