用红外透射谱和喇曼散射谱研究了退火对 Cd1 - x Znx Te晶片中 Te沉淀的影响 .研究结果表明 ,红外透射谱只对大尺寸的 Te沉淀较为敏感 ,而喇曼散射谱却能够探测到样品中小尺寸的 Te沉淀 ,两者互为补充 .在 Cd气氛下对晶片进行退火处理 ,选择合适的退火温度和退火时间 ,可以有效地消除晶片中大尺寸的 Te沉淀 ,却难以消除晶片中小尺寸的微量 Te沉淀 The effects of annealing on the precipitation of Te in Cd1 - xZnxTe wafers were investigated by infrared transmission spectrum and Raman scattering spectrum. The results show that infrared transmission spectrum is only sensitive to large Te precipitation, but Raman scattering spectrum can detect To the small size of the sample Te precipitation, the two complement each other in the Cd atmosphere annealing the wafer, select the appropriate annealing temperature and annealing time, you can effectively eliminate the large size of the wafer Te precipitation, it is difficult to eliminate the small The size of trace Te precipitation