科学技术和生产的发展,需要人们对各种物理现象、过程、材料等进行研究和控制,这不仅使仪表测量的种类不断增长,而且测量的领域和方法也不断深入和扩大。例如要求从直观接触的目标向微观和宏观世界的目标发展;从静态测量发展到动态测量;从单参数发展到多参数测量;从单个仪表发展到综合测试系统;从单纯检测发展到数据处理;从直接测量发展到间接测量等等。而在使用测量仪表的环境中,干扰因素及其强度也在 The development of science and technology and production require people to study and control various physical phenomena, processes, materials and the like. This not only increases the types of instrumentation, but also extends and expands the fields and methods of measurement. For example, it requires the development from the objective of direct contact to the goal of micro and macro world; from static measurement to dynamic measurement; from single parameter to multi-parameter measurement; from single instrument to integrated test system; from simple detection to data processing; From direct measurement to indirect measurement and more. In the environment where measuring instruments are used, the interference factor and its intensity are also present