基于Dirichlet先验分布的Bayes二项可靠性增长方法

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由于产品系统的复杂性和试验的高费用,并且产品的可靠性增长试验往往基于小样本,因此解决小样本问题在可靠性增长试验中也是非常重要的.借助Bayes理论,假设先验分布为Dirichlet分布,解决二项可靠性增长问题,能够充分借助先验分布和试验数据更合理估算出外场可靠性.同时在后验分布的计算上,利用Gibbs抽样的Markov Chain Morite Carlo(MCMC)方法仿真后验分布的计算.和传统的二项式Baye8方法进行比较,利用以Dirichlet分布为先验分布的Bayes方法非常适合阶段性可靠性增长
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