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从双极器件在快中子脉冲辐射下Frenkel缺陷的产生及其退火机理出发,推导出器件β在中子脉冲作用下随AF(t)和电荷浓度变化的数学模型。同时,给出器件中子脉冲作用下退火规律研究的实验方法及实验结果
Based on the generation of Frenkel defects and the annealing mechanism of bipolar devices under the fast neutron pulse irradiation, the mathematical model of the device β with the change of AF (t) and charge concentration under the action of neutron pulses is deduced. At the same time, experimental methods and experimental results of annealing rules under the effect of neutron pulses are given