论文部分内容阅读
在TFT-LCD面板生产过程中,缺陷分类是需要解决的关键问题之一。笔者对TFT-LCD的缺陷特征进行了定义,并提出了一种基于支持向量机的缺陷分类算法。实验结果表明,这种基于支持向量机的缺陷分类效果很好。
In the TFT-LCD panel production process, defect classification is one of the key issues to be solved. The author defines the defects of TFT-LCD and proposes a defect classification algorithm based on SVM. Experimental results show that this kind of SVM-based defect classification works well.