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本文提出了用常温下测试来代替负温筛选集成电路的新方法,其特点是简便、精确度较高。文章分析了这种测试的理论依据,测试项
In this paper, we propose a new method to replace integrated circuit with negative temperature test by testing at room temperature, which is characterized by simplicity and high accuracy. The article analyzes the theoretical basis of this test, test items