论文部分内容阅读
在分析加偏方法、所用元件、线路残量、加偏电压与相关元件功率的关系与保护方式的基础上,构置了可用于偏压下介电材料的电容量 CX 及损耗 TAN δ不同频率下温度特性测试装置.实验证明,该套装置可对样品不同偏压下的电容量和损耗的温度特性直接显示,并具有偏压范围宽,对不同偏压下介质材料可以在 0.5 HZ~1 M HZ 的频率范围进行温度特性测试.“,”In this paper,the circuit of measuring bias characteristic of the dielectric materials used electrical elements in the circuit,the inductance and resistance of the line between the clips of the sample and LCR meter,the conductance of the clips,the relation between bias and power of relative elements and the LCR meter is protected were analyzed according to the analysis above.A mesauring equipment of bias characterisic is proposed for measuring the dielectric constant and its tan of dielectric materials.The capacitance and tan of the samples directly display under different bias with the equipment,and it is wider bias(0~500 V)range than general meter.The temperature charactristic of the dielectric material can be measured in the range from 0.5 Hz to 1 MHz under different bias.