Conventional electron and optical microscopy techniques require the sample to be sectioned, polished or etched to expose the internal surfaces for imaging.However, such sample preparation techniques have traditionally prevented the observation of the same sample over time, under realistic three-dimensional geometries and in an environment representative of real-world operating conditions.X-ray microscopy (XRM) is a rapidly emerging technique that enables non-destructive evaluation of buried structures within hard to soft materials in 3D, requiring little to no sample preparation.