Structural Evolution of Microcrystalline Ge-rich Si1-xGex Films Deposited by Jet-ICPCVD in Annealing

来源 :The 6th International Conference on Nanoscience and Technolo | 被引量 : 0次 | 上传用户:guyehanxing
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  Ge-rich Si1-xGex films with a hybrid amorphous/nanocrystalline structure were deposited by jet-type inductively coupled plasma chemical-vapor deposition(jet-ICPCVD)[1].The structural evolution of the deposited films after annealing at various temperatures(Ta)was investigated.Experimental results show that the as-deposited film is hybrid-structured with amorphous and clusters.As arising Ta continually,a transformation from clusters to small SiGe NCs and finally to composite NCs with Ge core and SiGe shell is revealed.
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