随着我国集成电路工业的迅速发展,集成电路的应用日益广泛。集成电路的测试问题也日益增多。为了解决这些问题,我国各部门的集成电路测试人员研制了各种各样的集成电路测试仪器,取得了很多成果。一九八○年举行了我国首届半导体集成电路测试学术交流会,交流了我国多年来发展集成电路测试技术和研制集成电路测试仪器的经验,涉及各种集成度的数字电路特别是中规模逻辑电路、大规模集 With the rapid development of China’s integrated circuit industry, integrated circuits are increasingly widely used. Integrated circuit test problems are also increasing. In order to solve these problems, all kinds of integrated circuit testers in various departments of our country have developed various kinds of integrated circuit testers and achieved many achievements. In 1980, China held the first semiconductor integrated circuit test academic exchange, exchange of China’s many years of development of integrated circuit test technology and the development of integrated circuit test equipment experience, involving a variety of integrated digital circuits, especially medium-scale logic circuits Large-scale set