此文提供了星算法的一个LISP程序,它具有程序简短,所需存贮空间少的特点。由于采取了优化措施,它能方便地在微处理机上实现。借助此程序可以为给定的组合电路求出任一故障的完全测试集,以便进一步建立最佳的故障检测集。此程序也容易推广到求多故障和时序电路的测试集。 This article provides a LISP program of star algorithm, which has the characteristics of short program and less storage space. Thanks to optimization measures, it can be easily implemented on microprocessors. With this program, a complete test set of any one fault can be found for a given combinational circuit in order to further establish the optimal fault detection set. This program is also easy to generalize to test sets that seek multiple faults and timing circuits.