在微波波段介电常数ε_r 的测量通常采用(1)空腔微扰法;(2)波导法。这两种方法都需要样品厚度、频移和品质因数等的准确测量值。在多数情况下,测量系统需用介电常数已知的样品来校准。本文所讨论的方法,不需要高精度测量的样品厚度和别的参数值,不要求小的频移,没有复杂的表达式和计算。 In the microwave band dielectric constant ε_r measurement commonly used (1) cavity perturbation method; (2) waveguide method. Both of these methods require accurate measurements of sample thickness, frequency shift, and figure of merit. In most cases, the measurement system needs to be calibrated with a sample of known dielectric constant. The method discussed in this article does not require sample thickness and other parameter values ​​for high accuracy measurements, does not require small frequency shifts, no complicated expressions and calculations.