质子辐照制备HgCdTe光电二极管的性能研究

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用质子辐照p型碲镉汞材料的方法成功地制备了n-on-p型短波与中波光伏器件.其中中波器件的截止波长为6.5mm,黑体探测率达2.3x1010cmHz1/2W-1,量子效率为28%,其中R0A达157·cM2。C-V特性研究发现其为突变结。噪声频谱表明在低频(<300Hz)时主要由1/f噪声限制,在中频和高频时主要是白噪声限制。对辐照前后材料和器件的截止波长变化亦作出了初步解释。短波器件的电流电压特性表明器件在室温可承受15V的反向偏压。 N-on-p short-wave and mid-wave photovoltaic devices were successfully prepared by proton irradiation of p-type HgCdTe materials. Among them, the cut-off wavelength of the middle wave device is 6.5mm, the detection rate of blackbody is 2.3x1010cmHz1 / 2W-1, the quantum efficiency is 28%, and the R0A reaches 157 · cM2. C-V characterization study found that it is a mutant junction. The noise spectrum indicates that it is mainly limited by 1 / f noise at low frequencies (<300 Hz) and mainly by white noise at medium and high frequencies. A preliminary explanation of the change of the cutoff wavelength of the materials and devices before and after irradiation is also given. The current-voltage characteristics of the shortwave devices show that the device can withstand a reverse bias of 15V at room temperature.
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